Damian Poddebniak and Christian Dresen, Münster University of Applied Sciences; Jens Müller, Ruhr University Bochum; Fabian Ising and Sebastian Schinzel, Münster University of Applied Sciences; Simon Friedberger, NXP Semiconductors, Belgium; Juraj Somorovsky and Jörg Schwenk, Ruhr University Bochum